Defect Detection and Defect Code Decision Using Patch-Based Local-Feature-Guided Multi-Task YOLOv4

P.P. Le, S.M. Guo, J.C. Chen, James Jenn-Jier Lien

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	International Conference on Automation Technology (Auto)
Place of Publication	Hualien, Taiwan
Publication status	Published - 2020 Nov

Cite this

@inproceedings{b76b79e174d346fbb1bb3c2a228b3d87,

title = "Defect Detection and Defect Code Decision Using Patch-Based Local-Feature-Guided Multi-Task YOLOv4",

author = "P.P. Le and S.M. Guo and J.C. Chen and Lien, {James Jenn-Jier}",

year = "2020",

month = nov,

language = "English",

booktitle = "International Conference on Automation Technology (Auto)",

}