Defect level prediction using multi-model fault coverage

S.-K. Lu, T.-Y. Lee, Cheng-Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)
Original languageEnglish
Title of host publication10th VLSI Design/CAD Symposium
Place of PublicationNantou
Pages195-198
Publication statusPublished - 1999 Aug

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