| Original language | English |
|---|---|
| Title of host publication | 10th VLSI Design/CAD Symposium |
| Place of Publication | Nantou |
| Pages | 195-198 |
| Publication status | Published - 1999 Aug |
Defect level prediction using multi-model fault coverage
- S.-K. Lu
- , T.-Y. Lee
- , Cheng-Wen Wu
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
6
Citations
(Scopus)