Dependence of electrical properties on thermal reduction of protecting oxides for SOFC interconnect applications

Shu Yi Tsai, Kuan Zong Fung, Chung Ta Ni, Hsin Chia Ho

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In this study, plasma sprayed (Mn,Co)3O4 (MCO) coatings with spinel structure are used to form protective layer for metallic interconnects of solid oxide fuel cells. The temperature during thermal spraying is high enough to change the crystal structure and conductivity of protective oxides. The structure change is caused by the removal of oxygen ions at higher temperature. This behavior is so called thermal reduction. Furthermore, the transformation of MCO spinel to a NaCl type structure causes the degradation in its conductivity by several orders of magnitude. With better understanding and control of thermal reduction and/or phase transformation, it is believed that the proper heat treatment is an adequate method to obtain desired properties for protective oxide. Thus, the objective of this study is (1) to investigate the influence of thermal reduction on the conductivity and crystal structure; and (2) to improve the performance of interconnect through proper annealing at desired temperatures. XRD, SEM, and impedance spectroscopy are used to characterize the protective oxides before and after annealing and thermal reduction.

Original languageEnglish
Title of host publicationSolid Oxide Fuel Cells 14, SOFC 2015
EditorsK. Eguchi, S. C. Singhal
PublisherElectrochemical Society Inc.
Pages1641-1647
Number of pages7
Edition1
ISBN (Electronic)9781607685395
DOIs
Publication statusPublished - 2015 Jan 1
Event14th International Symposium on Solid Oxide Fuel Cells, SOFC 2015; held as part of the Electrochemical Society, ECS Conference on Electrochemical Energy Conversion and Storage - Glasgow, United Kingdom
Duration: 2015 Jul 262015 Jul 31

Publication series

NameECS Transactions
Number1
Volume68
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Other

Other14th International Symposium on Solid Oxide Fuel Cells, SOFC 2015; held as part of the Electrochemical Society, ECS Conference on Electrochemical Energy Conversion and Storage
CountryUnited Kingdom
CityGlasgow
Period15-07-2615-07-31

Fingerprint

Solid oxide fuel cells (SOFC)
Electric properties
Oxides
Crystal structure
Annealing
Thermal spraying
Temperature
Phase transitions
Heat treatment
Spectroscopy
Plasmas
Degradation
Coatings
Scanning electron microscopy
Oxygen
Hot Temperature
Ions

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Tsai, S. Y., Fung, K. Z., Ni, C. T., & Ho, H. C. (2015). Dependence of electrical properties on thermal reduction of protecting oxides for SOFC interconnect applications. In K. Eguchi, & S. C. Singhal (Eds.), Solid Oxide Fuel Cells 14, SOFC 2015 (1 ed., pp. 1641-1647). (ECS Transactions; Vol. 68, No. 1). Electrochemical Society Inc.. https://doi.org/10.1149/06801.1641ecst
Tsai, Shu Yi ; Fung, Kuan Zong ; Ni, Chung Ta ; Ho, Hsin Chia. / Dependence of electrical properties on thermal reduction of protecting oxides for SOFC interconnect applications. Solid Oxide Fuel Cells 14, SOFC 2015. editor / K. Eguchi ; S. C. Singhal. 1. ed. Electrochemical Society Inc., 2015. pp. 1641-1647 (ECS Transactions; 1).
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Tsai, SY, Fung, KZ, Ni, CT & Ho, HC 2015, Dependence of electrical properties on thermal reduction of protecting oxides for SOFC interconnect applications. in K Eguchi & SC Singhal (eds), Solid Oxide Fuel Cells 14, SOFC 2015. 1 edn, ECS Transactions, no. 1, vol. 68, Electrochemical Society Inc., pp. 1641-1647, 14th International Symposium on Solid Oxide Fuel Cells, SOFC 2015; held as part of the Electrochemical Society, ECS Conference on Electrochemical Energy Conversion and Storage, Glasgow, United Kingdom, 15-07-26. https://doi.org/10.1149/06801.1641ecst

Dependence of electrical properties on thermal reduction of protecting oxides for SOFC interconnect applications. / Tsai, Shu Yi; Fung, Kuan Zong; Ni, Chung Ta; Ho, Hsin Chia.

Solid Oxide Fuel Cells 14, SOFC 2015. ed. / K. Eguchi; S. C. Singhal. 1. ed. Electrochemical Society Inc., 2015. p. 1641-1647 (ECS Transactions; Vol. 68, No. 1).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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N2 - In this study, plasma sprayed (Mn,Co)3O4 (MCO) coatings with spinel structure are used to form protective layer for metallic interconnects of solid oxide fuel cells. The temperature during thermal spraying is high enough to change the crystal structure and conductivity of protective oxides. The structure change is caused by the removal of oxygen ions at higher temperature. This behavior is so called thermal reduction. Furthermore, the transformation of MCO spinel to a NaCl type structure causes the degradation in its conductivity by several orders of magnitude. With better understanding and control of thermal reduction and/or phase transformation, it is believed that the proper heat treatment is an adequate method to obtain desired properties for protective oxide. Thus, the objective of this study is (1) to investigate the influence of thermal reduction on the conductivity and crystal structure; and (2) to improve the performance of interconnect through proper annealing at desired temperatures. XRD, SEM, and impedance spectroscopy are used to characterize the protective oxides before and after annealing and thermal reduction.

AB - In this study, plasma sprayed (Mn,Co)3O4 (MCO) coatings with spinel structure are used to form protective layer for metallic interconnects of solid oxide fuel cells. The temperature during thermal spraying is high enough to change the crystal structure and conductivity of protective oxides. The structure change is caused by the removal of oxygen ions at higher temperature. This behavior is so called thermal reduction. Furthermore, the transformation of MCO spinel to a NaCl type structure causes the degradation in its conductivity by several orders of magnitude. With better understanding and control of thermal reduction and/or phase transformation, it is believed that the proper heat treatment is an adequate method to obtain desired properties for protective oxide. Thus, the objective of this study is (1) to investigate the influence of thermal reduction on the conductivity and crystal structure; and (2) to improve the performance of interconnect through proper annealing at desired temperatures. XRD, SEM, and impedance spectroscopy are used to characterize the protective oxides before and after annealing and thermal reduction.

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Tsai SY, Fung KZ, Ni CT, Ho HC. Dependence of electrical properties on thermal reduction of protecting oxides for SOFC interconnect applications. In Eguchi K, Singhal SC, editors, Solid Oxide Fuel Cells 14, SOFC 2015. 1 ed. Electrochemical Society Inc. 2015. p. 1641-1647. (ECS Transactions; 1). https://doi.org/10.1149/06801.1641ecst