Derivation of the generalized Young-Laplace equation of curved interfaces in nanoscaled solids

Tungyang Chen, Min Sen Chiu, Chung Ning Weng

Research output: Contribution to journalArticlepeer-review

273 Citations (Scopus)

Abstract

In nanoscaled solids, the mathematical behavior of a curved interface between two different phases with interface stress effects can be described by the generalized Young-Laplace equations [T. Young, Philos. Trans. R. Soc. London 95, 65 (1805); P. S. Laplace, Traite de Mechanique Celeste (Gauthier-Villars, Paris, 1805), Vol. 4, Supplements au Livre X]. Here we present a geometric illustration to prove the equations. By considering a small element of the curved thin interface, we model the interface stresses as in-plane stresses acting along its edges, while on the top and bottom faces of the interface the tractions are contributed from its three-dimensional bulk neighborhood. With this schematic illustration, simple force balance considerations will give the Young-Laplace equations across the interface. Similar procedures can be applied to conduction phenomena. This will allow us to reconstruct one type of imperfect interfaces, referred to as highly conducting interfaces.

Original languageEnglish
Article number074308
JournalJournal of Applied Physics
Volume100
Issue number7
DOIs
Publication statusPublished - 2006

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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