Design and Evaluation of Fault-Tolerant Interleaved Memory Systems

S.-K. Lu, S.-Y. Kuo, Cheng-Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication3rd IEEE Asian Test Symposium (ATS)
Place of PublicationNara
Pages354-359
Publication statusPublished - 1994 Nov

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