Original language | English |
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Title of host publication | 3rd IEEE Asian Test Symposium (ATS) |
Place of Publication | Nara |
Pages | 354-359 |
Publication status | Published - 1994 Nov |
Design and Evaluation of Fault-Tolerant Interleaved Memory Systems
S.-K. Lu, S.-Y. Kuo, Cheng-Wen Wu
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution