| Original language | English |
|---|---|
| Title of host publication | 3rd IEEE Asian Test Symposium (ATS) |
| Place of Publication | Nara |
| Pages | 354-359 |
| Publication status | Published - 1994 Nov |
Design and Evaluation of Fault-Tolerant Interleaved Memory Systems
S.-K. Lu, S.-Y. Kuo, Cheng-Wen Wu
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution