Design and verification of an integrated current mode switching regulator

Chun Sheng Huang, Chien Hung Tsai, Jia Hui Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, a design of current-mode control switching regulator was presented with loop gain analysis. The analysis was verified by the chip implementation and measurement. A current mirror based current sensor was used to sensing the inductor current information. This chip has been fabricated with a TSMC 2P4M 0.35m polyside CMOS process. The measurement result verify the buck converter with on-chip current sensing can operate with load current from 200mA-500mA in a supply voltage from 2.74.2V and the output voltage of 1.8V with no sub-harmonic condition occur. By the loop gain measurement, the correctness of the loop gain analysis is verified. The stability of proposed buck converter was guaranteed by the loop gain measurement, too.

Original languageEnglish
Title of host publicationProceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
Pages362-365
Number of pages4
DOIs
Publication statusPublished - 2011 Jun 28
Event2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011 - Hsinchu, Taiwan
Duration: 2011 Apr 252011 Apr 28

Publication series

NameProceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011

Other

Other2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
CountryTaiwan
CityHsinchu
Period11-04-2511-04-28

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Design and verification of an integrated current mode switching regulator'. Together they form a unique fingerprint.

  • Cite this

    Huang, C. S., Tsai, C. H., & Wang, J. H. (2011). Design and verification of an integrated current mode switching regulator. In Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011 (pp. 362-365). [5783548] (Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011). https://doi.org/10.1109/VDAT.2011.5783548