Abstract
This article presents 75-110-GHz highly isolated T/R switch in 90nm CMOS. The proposed T/R switch circuit design is focused on highly isolation performance which is achieved by using both parallel inductors and leakage-cancellation techniques. To also reduce insertion loss which is also an important design key point, series-shunt single-pole double throw (SPDT) switch with optimizing transistors size and body-floating technique are adopted. From the experiment results, the designed switch has good performance of the return loss, insertion loss and isolation in W-band. Compared with some previously reported works, the designed switch has the best isolation performance of 48 dB at 94-GHz, and IP1dB is > 9dBm, respectively.
Original language | English |
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Pages (from-to) | 2725-2731 |
Number of pages | 7 |
Journal | Microwave and Optical Technology Letters |
Volume | 58 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2016 Nov 1 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Electrical and Electronic Engineering