Design of a scalable RSA and ECC crypto-processor

Ming Cheng Sun, Chih Pin Su, Chih Tsun Huang, Cheng Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Citations (Scopus)

Abstract

In this paper, we propose a scalable word-based crypto-processor that performs modular multiplication based on the modified Montgomery algorithm for finite fields GF(P) and GF(2m). The unified crypto-processor supports scalable keys of length up to 2048 bits for RSA and 512 bits for elliptic curve cryptography (ECC). Further extension of the key length can be done easily by enlarging the memory module or using the external memory resource. With the proposed parity prediction technique, our pipelined crypto-processor achieves a 512-bit RSA encryption rate of 276 kbps and a 160-bit ECC encryption rate of 73.3 kbps for a 220 MHz clock rate.

Original languageEnglish
Title of host publicationProceedings of the ASP-DAC 2003 Asia and South Pacific Design Automation Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages495-498
Number of pages4
ISBN (Electronic)0780376595
DOIs
Publication statusPublished - 2003 Jan 1
EventAsia and South Pacific Design Automation Conference, ASP-DAC 2003 - Kitakyushu, Japan
Duration: 2003 Jan 212003 Jan 24

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
Volume2003-January

Other

OtherAsia and South Pacific Design Automation Conference, ASP-DAC 2003
CountryJapan
CityKitakyushu
Period03-01-2103-01-24

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

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  • Cite this

    Sun, M. C., Su, C. P., Huang, C. T., & Wu, C. W. (2003). Design of a scalable RSA and ECC crypto-processor. In Proceedings of the ASP-DAC 2003 Asia and South Pacific Design Automation Conference (pp. 495-498). [1195066] (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC; Vol. 2003-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ASPDAC.2003.1195066