| Original language | English |
|---|---|
| Title of host publication | 2nd IEEE Asian Test Symposium (ATS) |
| Place of Publication | Beijing |
| Pages | 281-286 |
| Publication status | Published - 1993 Nov |
Design of Efficient Totally Self-checking Checkers for m-out-of-n Code
W.-F. Chang, Cheng-Wen Wu
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution