Design of Efficient Totally Self-checking Checkers for m-out-of-n Code

W.-F. Chang, Cheng-Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication2nd IEEE Asian Test Symposium (ATS)
Place of PublicationBeijing
Pages281-286
Publication statusPublished - 1993 Nov

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