TY - GEN
T1 - Design of high-throughput MIMO detectors using sort-free and early-pruned techniques
AU - Lin, Jing Shiun
AU - Fang, Shih Hao
AU - Jen, Yi Hsuan
AU - Shieh, Ming Der
PY - 2010/12/1
Y1 - 2010/12/1
N2 - This paper presents a high-throughput multiple-input multiple-output (MIMO) signal detector based on the sort-free concept and the proposed mean-aided early-pruned scheme. The derived MIMO detector can reduce the number of node computation while maintaining the bit error rate (BER) performance of the conventional sort-free MIMO detection algorithm. Experimental results show that the proposed detector design with 4×4 antenna array and 16-QAM modulation has better normalized throughput rate compared to those of existing detectors under the same system configurations. Moreover, a significant reduction on node extensions can be achieved using the presented detection scheme compared with the conventional sort-free algorithm and the K-best algorithm.
AB - This paper presents a high-throughput multiple-input multiple-output (MIMO) signal detector based on the sort-free concept and the proposed mean-aided early-pruned scheme. The derived MIMO detector can reduce the number of node computation while maintaining the bit error rate (BER) performance of the conventional sort-free MIMO detection algorithm. Experimental results show that the proposed detector design with 4×4 antenna array and 16-QAM modulation has better normalized throughput rate compared to those of existing detectors under the same system configurations. Moreover, a significant reduction on node extensions can be achieved using the presented detection scheme compared with the conventional sort-free algorithm and the K-best algorithm.
UR - http://www.scopus.com/inward/record.url?scp=79951638827&partnerID=8YFLogxK
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U2 - 10.1109/TENCON.2010.5686145
DO - 10.1109/TENCON.2010.5686145
M3 - Conference contribution
AN - SCOPUS:79951638827
SN - 9781424468904
T3 - IEEE Region 10 Annual International Conference, Proceedings/TENCON
SP - 1513
EP - 1516
BT - TENCON 2010 - 2010 IEEE Region 10 Conference
T2 - 2010 IEEE Region 10 Conference, TENCON 2010
Y2 - 21 November 2010 through 24 November 2010
ER -