Design of reliable a-Si:H gate driver circuit with high immunity against the VTH shift of TFT and output fluctuations

Min Chin Chuang; Chun Da Tu; Kuan Wen Chou; Chih Lung Lin

doi:10.1109/PHOTONICS.2010.5698881

Design of reliable a-Si:H gate driver circuit with high immunity against the V_TH shift of TFT and output fluctuations

Min Chin Chuang, Chun Da Tu, Kuan Wen Chou, Chih Lung Lin

Department of Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

AC-driving structure is utilized in this new gate driver circuit to suppress VTH shift of a-Si:H TFT. By modulating the biased-stress on pull-down TFT, the floating row lines of panels is effectively eliminated. The results depict this circuit can ensure the longer operating lifetime.

Original language	English
Title of host publication	2010 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010
Pages	305-306
Number of pages	2
DOIs	https://doi.org/10.1109/PHOTONICS.2010.5698881
Publication status	Published - 2010 Dec 1
Event	23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010 - Denver, CO, United States Duration: 2010 Nov 7 → 2010 Nov 11

Publication series

Name	2010 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010

Other

Other	23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010
Country/Territory	United States
City	Denver, CO
Period	10-11-07 → 10-11-11

All Science Journal Classification (ASJC) codes

Atomic and Molecular Physics, and Optics

Access to Document

10.1109/PHOTONICS.2010.5698881

Cite this

Chuang, M. C., Tu, C. D., Chou, K. W., & Lin, C. L. (2010). Design of reliable a-Si:H gate driver circuit with high immunity against the V_TH shift of TFT and output fluctuations. In 2010 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010 (pp. 305-306). [5698881] (2010 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010). https://doi.org/10.1109/PHOTONICS.2010.5698881

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title = "Design of reliable a-Si:H gate driver circuit with high immunity against the VTH shift of TFT and output fluctuations",

abstract = "AC-driving structure is utilized in this new gate driver circuit to suppress VTH shift of a-Si:H TFT. By modulating the biased-stress on pull-down TFT, the floating row lines of panels is effectively eliminated. The results depict this circuit can ensure the longer operating lifetime.",

author = "Chuang, {Min Chin} and Tu, {Chun Da} and Chou, {Kuan Wen} and Lin, {Chih Lung}",

year = "2010",

month = dec,

day = "1",

doi = "10.1109/PHOTONICS.2010.5698881",

language = "English",

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series = "2010 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010",

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booktitle = "2010 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010",

note = "23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010 ; Conference date: 07-11-2010 Through 11-11-2010",

}

Chuang, MC, Tu, CD, Chou, KW & Lin, CL 2010, Design of reliable a-Si:H gate driver circuit with high immunity against the V_TH shift of TFT and output fluctuations. in 2010 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010., 5698881, 2010 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010, pp. 305-306, 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010, Denver, CO, United States, 10-11-07. https://doi.org/10.1109/PHOTONICS.2010.5698881

Design of reliable a-Si:H gate driver circuit with high immunity against the V_TH shift of TFT and output fluctuations. / Chuang, Min Chin; Tu, Chun Da; Chou, Kuan Wen et al.
2010 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010. 2010. p. 305-306 5698881 (2010 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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