Design of reliable a-Si:H gate driver circuit with high immunity against the VTH shift of TFT and output fluctuations

Min Chin Chuang, Chun Da Tu, Kuan Wen Chou, Chih Lung Lin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

AC-driving structure is utilized in this new gate driver circuit to suppress VTH shift of a-Si:H TFT. By modulating the biased-stress on pull-down TFT, the floating row lines of panels is effectively eliminated. The results depict this circuit can ensure the longer operating lifetime.

Original languageEnglish
Title of host publication2010 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010
Pages305-306
Number of pages2
DOIs
Publication statusPublished - 2010 Dec 1
Event23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010 - Denver, CO, United States
Duration: 2010 Nov 72010 Nov 11

Publication series

Name2010 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010

Other

Other23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010
Country/TerritoryUnited States
CityDenver, CO
Period10-11-0710-11-11

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

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