Determination of depth profiles of Ni80Fe20 epifilms on Mo buffered Al2O3 substrates with and without a Co interlayer by polarized neutron and X-ray reflectivity

Kuan Li Yu, Chih Hao Lee, J. C.A. Huang, Hui Chia Su, G. P. Felcher

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

Polarized neutron and X-ray reflectivity are complementary tools used to measure the depth profile of magnetic thin films. In this work, permalloy thin films were epitaxially deposited on Mo buffered Al2O3 (1-100) substrates with a Co interlayer and without a Co interlayer. The interface structure between the permalloy and the Co layers, determined by X-ray reflectivity alone, was insensitive, due to the low contrast of the electron density between these two adjacent layers. It can however, be determined by polarized neutron reflectivity, due to the large difference of the nuclear scattering lengths and magnetic moments between these two layers.

Original languageEnglish
Pages (from-to)616-623
Number of pages8
JournalChinese Journal of Physics
Volume40
Issue number6
Publication statusPublished - 2002

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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