Determination of depth profiles of Ni80Fe20 epifilms on Mo buffered Al2O3 substrates with and without a Co interlayer by polarized neutron and X-ray reflectivity
- Kuan Li Yu
- , Chih Hao Lee
- , J. C.A. Huang
- , Hui Chia Su
- , G. P. Felcher
Research output: Contribution to journal › Article › peer-review
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