Determination of residual strain by combining EBSD and DIC techniques

Jui Chao Kuo, Han Hong Wang

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)


Electron Back-Scatter Diffraction (EBSD) can be applied to determine lattice defect and local strain distortion. The strain components were obtained with the help of the shifting of zone axis in Kikuchi patterns generated from EBSD. The displacement of zone axis in Kikuchi pattern was determined by using Digital Image Correlation (DIC) method, which provides a great resolution down to 0.01 pixels, which means the ideal sensitivity to be ̃3.6 × 10-5. However, the errors of calculating the residual strain can result from the image quality of Kikuchi patterns, such as the formation of dark areas in the Kikuchi patterns and the background noise.

Original languageEnglish
Pages (from-to)328-337
Number of pages10
JournalInternational Journal of Materials and Product Technology
Issue number3-4
Publication statusPublished - 2010 Feb

All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality
  • Mechanics of Materials
  • Mechanical Engineering
  • Industrial and Manufacturing Engineering


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