Determining manufacturing parameters to suppress system variance using linear and non-linear models

Der-Chiang Li, Wen Chih Chen, Chiao Wen Liu, Che Jung Chang, Chien Chih Chen

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Determining manufacturing parameters for a new product is fundamentally a difficult problem, because there has little suggestion information. There are several researches on this topic, and most of them focus on single specific model or the engineer's experience. As to other approaches, the usage of multiple models may be an alternative approach to help determining the parameters. This research proposed an aggregation of multiple regression and back-propagation neural network to find the manufacturing parameter's limits (upper and lower limits). A real-problem of a new product parameter setting model in the real Thin Film Transistor-Liquid Crystal Display (TFT-LCD) manufacturing company is demonstrated, where three forecasting models are applied, and t test is used to judge which models are the suitable ones. Finally, we average the computed parameter values from the chosen models to suppress the system variance. The empirical results show that the proposed method is successful in suppressing the system variance and improving the production yields.

Original languageEnglish
Pages (from-to)4020-4025
Number of pages6
JournalExpert Systems With Applications
Volume39
Issue number4
DOIs
Publication statusPublished - 2012 Mar 1

Fingerprint

Thin film transistors
Liquid crystal displays
Backpropagation
Agglomeration
Neural networks
Engineers
Industry

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Computer Science Applications
  • Artificial Intelligence

Cite this

Li, Der-Chiang ; Chen, Wen Chih ; Liu, Chiao Wen ; Chang, Che Jung ; Chen, Chien Chih. / Determining manufacturing parameters to suppress system variance using linear and non-linear models. In: Expert Systems With Applications. 2012 ; Vol. 39, No. 4. pp. 4020-4025.
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Determining manufacturing parameters to suppress system variance using linear and non-linear models. / Li, Der-Chiang; Chen, Wen Chih; Liu, Chiao Wen; Chang, Che Jung; Chen, Chien Chih.

In: Expert Systems With Applications, Vol. 39, No. 4, 01.03.2012, p. 4020-4025.

Research output: Contribution to journalArticle

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