Developing an automatic virtual metrology system

Fan Tien Cheng, Hsien Cheng Huang, Chi An Kao

Research output: Contribution to journalArticlepeer-review

83 Citations (Scopus)


Virtual Metrology (VM) is a method to conjecture manufacturing quality of a process tool based on data sensed from the process tool and without physical metrology operations. VM has now been designated by the International SEMATECH Manufacturing Initiative and International Technology Roadmap for Semiconductors as one of the focus areas for the next-generation factory realization roadmap of the semiconductor industry. This paper defines the VM automation levels, proposes the concept of automatic virtual metrology (AVM), and develops an AVM system for automatic and fab-wide VM deployment. The example of automatic VM model refreshing for chemical vapor deposition (CVD) tools is also illustrated in this paper. The AVM system has been successfully deployed in a fifth-generation thin-film-transistor-liquid-crystal-display (TFT-LCD) factory in Chi Mei Optoelectronics (CMO), Taiwan.

Original languageEnglish
Article number6051498
Pages (from-to)181-188
Number of pages8
JournalIEEE Transactions on Automation Science and Engineering
Issue number1
Publication statusPublished - 2012 Jan

All Science Journal Classification (ASJC) codes

  • Control and Systems Engineering
  • Electrical and Electronic Engineering


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