Development of an e-Diagnostics/Maintenance framework for semiconductor factories with security considerations

Min Hsiung Hung, Kuan Yii Chen, Rui Wen Ho, Fan Tien Cheng

Research output: Contribution to journalArticlepeer-review

45 Citations (Scopus)

Abstract

In recent years, the concept of e-Diagnostics and e-Maintenance is proposed in the semiconductor industry. By using Internet and information technologies, e-Diagnostics and e-Maintenance intend to provide equipment specialists with the remote capabilities of connectivity, manipulation, configuration, performance monitoring, and data collection and analysis on equipment to achieve the goal of promptly diagnosing, repairing, and maintaining equipment. In this paper, new-generation information software technologies and object-oriented technologies, such as Web Services, XML signature, XML encryption, UML, etc. are used to develop an e-Diagnostics/Maintenance framework with security considerations. The proposed framework can achieve the automaton of diagnostic processes and the integration of diagnostics and maintenance information under a secure communication infrastructure.

Original languageEnglish
Pages (from-to)165-178
Number of pages14
JournalAdvanced Engineering Informatics
Volume17
Issue number3-4
DOIs
Publication statusPublished - 2003 Jul 1

All Science Journal Classification (ASJC) codes

  • Information Systems
  • Artificial Intelligence

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