A new multipoint Thomson Scattering measurement system has been developed using multiple refrections and time-of-flight of laser light. The new idea of our system is to utilize the time delay of the scattered light of the multiplly reflected laser beam as a means to save the numbers of spectrometers and detectors. They enabled us to measure one dimensional profile of electron temperature and density by a single polychromator, proving its basic principle.
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering