Development of multipoint thomson scattering measurement system using multiple reflections and the time-of-flight of laser light

Shingo Ito, Takashi Sumikawa, Eiichiro Kawamori, Yasushi Ono

Research output: Contribution to journalArticle

Abstract

A new multipoint Thomson Scattering measurement system has been developed using multiple refrections and time-of-flight of laser light. The new idea of our system is to utilize the time delay of the scattered light of the multiplly reflected laser beam as a means to save the numbers of spectrometers and detectors. They enabled us to measure one dimensional profile of electron temperature and density by a single polychromator, proving its basic principle.

Original languageEnglish
Pages (from-to)499-500
Number of pages2
JournalIEEJ Transactions on Fundamentals and Materials
Volume128
Issue number7
DOIs
Publication statusPublished - 2008 Dec 1

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All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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