Differential Mueller matrix polarimetry for low concentration of glucose sensing

Quoc Hung Phan, Yu Lung Lo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A novel of glucose sensing method based on differential Mueller matrix polarimetry is proposed. An analytical model is derived for extracting the optical rotation angle (γ) and degree of depolarization properties (Δ) of glucose sample with scattering affects. The practical feasibility of the proposed method is demonstrated by the experimental results for the sensitivity of the γ and Δ with the glucose samples with 2% phantom particles. The results show that the extracted valued of γ and Δ vary linearly with the glucose concentration over the measured range of 0 to 100 mg/dl with lowest increment of 20 mg/dl. In general, the proposed technique provides a reliable and simple method for low concentration of glucose sensing.

Original languageEnglish
Title of host publicationBiomedical Imaging and Sensing Conference
EditorsYasuhiro Awatsuji, Osamu Matoba, Yoshihisa Aizu, Toyohiko Yatagai
PublisherSPIE
ISBN (Electronic)9781510610033
DOIs
Publication statusPublished - 2017 Jan 1
Event3rd Biomedical Imaging and Sensing Conference - Yokohama, Japan
Duration: 2017 Apr 192017 Apr 21

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10251
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

Other3rd Biomedical Imaging and Sensing Conference
CountryJapan
CityYokohama
Period17-04-1917-04-21

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Phan, Q. H., & Lo, Y. L. (2017). Differential Mueller matrix polarimetry for low concentration of glucose sensing. In Y. Awatsuji, O. Matoba, Y. Aizu, & T. Yatagai (Eds.), Biomedical Imaging and Sensing Conference [102511M] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10251). SPIE. https://doi.org/10.1117/12.2269428