TY - GEN
T1 - Digital determination of the secondary principal stress parameters in scattered-light photoelasticity
AU - Lee, H. L.
AU - Chen, Terry Yuan-Fang
PY - 2006/10/31
Y1 - 2006/10/31
N2 - Scattered-light photoelasticity provides a nondestructive approach for analyzing the secondary principal stresses in a 3D photoelastic model. In this paper, a method is proposed to determine the whole-field secondary photoelastic parameters (isoclinics and isochromatics) using polarized incident light in the scatted-light photoelasticity. Relevant theory is derived and explained. Two polarization-stepped loaded model images and the associated unloaded model images are used to determine the isoclinic angle and the fractional retardation or fringe order. Tests of this method on a circular disk under diametrical compression are demonstrated. The digitally determined secondary principal stress direction agrees well with the theory.
AB - Scattered-light photoelasticity provides a nondestructive approach for analyzing the secondary principal stresses in a 3D photoelastic model. In this paper, a method is proposed to determine the whole-field secondary photoelastic parameters (isoclinics and isochromatics) using polarized incident light in the scatted-light photoelasticity. Relevant theory is derived and explained. Two polarization-stepped loaded model images and the associated unloaded model images are used to determine the isoclinic angle and the fractional retardation or fringe order. Tests of this method on a circular disk under diametrical compression are demonstrated. The digitally determined secondary principal stress direction agrees well with the theory.
UR - http://www.scopus.com/inward/record.url?scp=33750381294&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33750381294&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:33750381294
SN - 091205395X
SN - 9780912053950
T3 - Proceedings of the 2006 SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006
SP - 1589
EP - 1595
BT - Proceedings of the 2006 SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006
T2 - SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006
Y2 - 4 June 2006 through 7 June 2006
ER -