Abstract
Scattered-light photoelasticity provides a nondestructive approach for analyzing the secondary principal stresses in a 3D photoelastic model. In this paper, a method is proposed to determine the whole-field secondary photoelastic parameters (isoclinics and isochromatics) using polarized incident light in the scatted-light photoelasticity. Relevant theory is derived and explained. Two polarization-stepped loaded model images and the associated unloaded model images are used to determine the isoclinic angle and the fractional retardation or fringe order. Tests of this method on a circular disk under diametrical compression are demonstrated. The digitally determined secondary principal stress direction agrees well with the theory.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 2006 SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006 |
| Pages | 1589-1595 |
| Number of pages | 7 |
| Publication status | Published - 2006 Oct 31 |
| Event | SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006 - Saint Louis, MO, United States Duration: 2006 Jun 4 → 2006 Jun 7 |
Publication series
| Name | Proceedings of the 2006 SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006 |
|---|---|
| Volume | 3 |
Other
| Other | SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006 |
|---|---|
| Country | United States |
| City | Saint Louis, MO |
| Period | 06-06-04 → 06-06-07 |
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All Science Journal Classification (ASJC) codes
- Engineering(all)
Cite this
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Digital determination of the secondary principal stress parameters in scattered-light photoelasticity. / Lee, H. L.; Chen, Terry Yuan-Fang.
Proceedings of the 2006 SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006. 2006. p. 1589-1595 (Proceedings of the 2006 SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006; Vol. 3).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - Digital determination of the secondary principal stress parameters in scattered-light photoelasticity
AU - Lee, H. L.
AU - Chen, Terry Yuan-Fang
PY - 2006/10/31
Y1 - 2006/10/31
N2 - Scattered-light photoelasticity provides a nondestructive approach for analyzing the secondary principal stresses in a 3D photoelastic model. In this paper, a method is proposed to determine the whole-field secondary photoelastic parameters (isoclinics and isochromatics) using polarized incident light in the scatted-light photoelasticity. Relevant theory is derived and explained. Two polarization-stepped loaded model images and the associated unloaded model images are used to determine the isoclinic angle and the fractional retardation or fringe order. Tests of this method on a circular disk under diametrical compression are demonstrated. The digitally determined secondary principal stress direction agrees well with the theory.
AB - Scattered-light photoelasticity provides a nondestructive approach for analyzing the secondary principal stresses in a 3D photoelastic model. In this paper, a method is proposed to determine the whole-field secondary photoelastic parameters (isoclinics and isochromatics) using polarized incident light in the scatted-light photoelasticity. Relevant theory is derived and explained. Two polarization-stepped loaded model images and the associated unloaded model images are used to determine the isoclinic angle and the fractional retardation or fringe order. Tests of this method on a circular disk under diametrical compression are demonstrated. The digitally determined secondary principal stress direction agrees well with the theory.
UR - http://www.scopus.com/inward/record.url?scp=33750381294&partnerID=8YFLogxK
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M3 - Conference contribution
SN - 091205395X
SN - 9780912053950
T3 - Proceedings of the 2006 SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006
SP - 1589
EP - 1595
BT - Proceedings of the 2006 SEM Annual Conference and Exposition on Experimental and Applied Mechanics 2006
ER -