Direct spectroscopic evidence of charge reversal at the Pb(Zr 0.2Ti0.8)O3/La0.7Sr 0.3MnO3 heterointerface

Chung-Lin Wu, Pei Wei Lee, Yi-Chun Chen, Lo Yueh Chang, Chia Hao Chen, Chen Wei Liang, Pu Yu, Qing He, R. Ramesh, Ying Hao Chu

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16 Citations (Scopus)

Abstract

At the heterointerface of a top ferroelectric Pb(Zr0.2Ti 0.8)O3 (PZT) ultrathin film and a bottom La 0.7Sr0.3MnO3 (LSMO) electrode, we used continuous synchrotron-radiation photoelectron spectroscopy to probe in situ and demonstrated that the interfacial charges are reversible and their affected valence-band barrier height becomes modulated upon switching the polarization in the top layer. By monitoring the core-level shifting of the buried LSMO layer under continuous illumination of synchrotron radiation, we directly observed a temporal screening of polarization induced by the photon-generated carriers in the top PZT layer. This dynamic characterization of the core-level shifting of the buried layer demonstrates an effective method to probe the electric conduction and ferroelectric polarization of an ultrathin ferroelectric oxide thin film.

Original languageEnglish
Article number020103
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume83
Issue number2
DOIs
Publication statusPublished - 2011 Jan 21

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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