Direct spectroscopic evidence of charge reversal at the Pb(Zr 0.2Ti0.8)O3/La0.7Sr 0.3MnO3 heterointerface

Chung-Lin Wu, Pei Wei Lee, Yi-Chun Chen, Lo Yueh Chang, Chia Hao Chen, Chen Wei Liang, Pu Yu, Qing He, R. Ramesh, Ying Hao Chu

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

At the heterointerface of a top ferroelectric Pb(Zr0.2Ti 0.8)O3 (PZT) ultrathin film and a bottom La 0.7Sr0.3MnO3 (LSMO) electrode, we used continuous synchrotron-radiation photoelectron spectroscopy to probe in situ and demonstrated that the interfacial charges are reversible and their affected valence-band barrier height becomes modulated upon switching the polarization in the top layer. By monitoring the core-level shifting of the buried LSMO layer under continuous illumination of synchrotron radiation, we directly observed a temporal screening of polarization induced by the photon-generated carriers in the top PZT layer. This dynamic characterization of the core-level shifting of the buried layer demonstrates an effective method to probe the electric conduction and ferroelectric polarization of an ultrathin ferroelectric oxide thin film.

Original languageEnglish
Article number020103
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume83
Issue number2
DOIs
Publication statusPublished - 2011 Jan 21

Fingerprint

Ferroelectric materials
Core levels
Polarization
Synchrotron radiation
synchrotron radiation
polarization
Ultrathin films
Photoelectron spectroscopy
Valence bands
Oxide films
probes
Screening
Photons
Lighting
Thin films
Electrodes
screening
Monitoring
illumination
photoelectron spectroscopy

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Wu, Chung-Lin ; Lee, Pei Wei ; Chen, Yi-Chun ; Chang, Lo Yueh ; Chen, Chia Hao ; Liang, Chen Wei ; Yu, Pu ; He, Qing ; Ramesh, R. ; Chu, Ying Hao. / Direct spectroscopic evidence of charge reversal at the Pb(Zr 0.2Ti0.8)O3/La0.7Sr 0.3MnO3 heterointerface. In: Physical Review B - Condensed Matter and Materials Physics. 2011 ; Vol. 83, No. 2.
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abstract = "At the heterointerface of a top ferroelectric Pb(Zr0.2Ti 0.8)O3 (PZT) ultrathin film and a bottom La 0.7Sr0.3MnO3 (LSMO) electrode, we used continuous synchrotron-radiation photoelectron spectroscopy to probe in situ and demonstrated that the interfacial charges are reversible and their affected valence-band barrier height becomes modulated upon switching the polarization in the top layer. By monitoring the core-level shifting of the buried LSMO layer under continuous illumination of synchrotron radiation, we directly observed a temporal screening of polarization induced by the photon-generated carriers in the top PZT layer. This dynamic characterization of the core-level shifting of the buried layer demonstrates an effective method to probe the electric conduction and ferroelectric polarization of an ultrathin ferroelectric oxide thin film.",
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Direct spectroscopic evidence of charge reversal at the Pb(Zr 0.2Ti0.8)O3/La0.7Sr 0.3MnO3 heterointerface. / Wu, Chung-Lin; Lee, Pei Wei; Chen, Yi-Chun; Chang, Lo Yueh; Chen, Chia Hao; Liang, Chen Wei; Yu, Pu; He, Qing; Ramesh, R.; Chu, Ying Hao.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 83, No. 2, 020103, 21.01.2011.

Research output: Contribution to journalArticle

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T1 - Direct spectroscopic evidence of charge reversal at the Pb(Zr 0.2Ti0.8)O3/La0.7Sr 0.3MnO3 heterointerface

AU - Wu, Chung-Lin

AU - Lee, Pei Wei

AU - Chen, Yi-Chun

AU - Chang, Lo Yueh

AU - Chen, Chia Hao

AU - Liang, Chen Wei

AU - Yu, Pu

AU - He, Qing

AU - Ramesh, R.

AU - Chu, Ying Hao

PY - 2011/1/21

Y1 - 2011/1/21

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