TY - GEN
T1 - Dispersion-corrected metasurface for beam deflector and flat lens
AU - Yan, Libin
AU - Cat, Hong
AU - Gu, Yuan Dong
AU - Zhu, Weiming
AU - Wu, Pin Chieh
AU - Yang, Zhengchuan
AU - Jin, Yefeng
AU - Hao, Yulong
AU - Kwong, Dim Lee
AU - Liu, Ai Qun
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/2/26
Y1 - 2016/2/26
N2 - In this paper, a reconfigurable metasurface is realized using microfluidic technology, which controls the amplitude and phase of the incident wave at sub-wavelength resolution. A dispersion-corrected beam deflector and a flat lens are demonstrated for proof-of-principle where the flat lens and beam deflector are tuned, in response to the change of the incident wavelength, to maintain their functionalities. This will make various applications such as on-chip spectrometers, high-performance dispersion-controllable devices in the next-generation telecommunication networks, and wavefront-tunable devices.
AB - In this paper, a reconfigurable metasurface is realized using microfluidic technology, which controls the amplitude and phase of the incident wave at sub-wavelength resolution. A dispersion-corrected beam deflector and a flat lens are demonstrated for proof-of-principle where the flat lens and beam deflector are tuned, in response to the change of the incident wavelength, to maintain their functionalities. This will make various applications such as on-chip spectrometers, high-performance dispersion-controllable devices in the next-generation telecommunication networks, and wavefront-tunable devices.
UR - http://www.scopus.com/inward/record.url?scp=84970959772&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84970959772&partnerID=8YFLogxK
U2 - 10.1109/MEMSYS.2016.7421697
DO - 10.1109/MEMSYS.2016.7421697
M3 - Conference contribution
AN - SCOPUS:84970959772
T3 - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
SP - 601
EP - 604
BT - MEMS 2016 - 29th IEEE International Conference on Micro Electro Mechanical Systems
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 29th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2016
Y2 - 24 January 2016 through 28 January 2016
ER -