Disruption of crystalline structure of Sn3.5Ag induced by electric current

Han Chie Huang, Kwang Lung Lin, Albert T. Wu

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

This study presented the disruption of the Sn and Ag3Sn lattice structures of Sn3.5Ag solder induced by electric current at 5-7 × 103 A/cm2 with a high resolution transmission electron microscope investigation and electron diffraction analysis. The electric current stressing induced a high degree of strain on the alloy, as estimated from the X-ray diffraction (XRD) peak shift of the current stressed specimen. The XRD peak intensity of the Sn matrix and the Ag3Sn intermetallic compound diminished to nearly undetectable after 2 h of current stressing. The electric current stressing gave rise to a high dislocation density of up to 1017/m2. The grain morphology of the Sn matrix became invisible after prolonged current stressing as a result of the coalescence of dislocations.

Original languageEnglish
Article number115102
JournalJournal of Applied Physics
Volume119
Issue number11
DOIs
Publication statusPublished - 2016 Mar 21

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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