Distributed diagnostic fault simulation for synchronous sequential circuits by dynamic fault partitioning

Jer-Min Jou, Shung Chih Chen

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)

Abstract

In this paper, a distributed diagnostic fault simulation for sequential circuits by dynamic fault partitioning is proposed, in which the indistinguishable faults for all the detectable faults are obtained from different machines. Several ISCAS89 benchmark circuits have been experimented on. For a circuit s35932, less than one hour of CPU time is spent by using 4 SUN SPARC stations II.

Original languageEnglish
Pages (from-to)2004-2007
Number of pages4
JournalProceedings - IEEE International Symposium on Circuits and Systems
Volume3
Publication statusPublished - 1995 Jan 1
EventProceedings of the 1995 IEEE International Symposium on Circuits and Systems-ISCAS 95. Part 3 (of 3) - Seattle, WA, USA
Duration: 1995 Apr 301995 May 3

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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