Distribution of electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface revealed by hard x-ray photoemission spectroscopy

Y. Y. Chu, Y. F. Liao, V. T. Tra, J. C. Yang, W. Z. Liu, Y. H. Chu, J. Y. Lin, J. H. Huang, J. Weinen, S. Agrestini, K. D. Tsuei, D. J. Huang

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10 Citations (Scopus)

Abstract

We investigated the electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface with hard x-ray photoelectron spectroscopy (HAXPES) under grazing incidence. By exploiting the collapse of evanescent x-ray waves and the abrupt increase of x-ray absorption at the critical incidence angle, our HAXPES study reveals a 2% electronic reconstruction from Ti 4+ to Ti 3+ occurring near the interface. Such an electronic reconstruction also extends from the interface into SrTiO 3 with a depth of about 48Å (∼12 unit cells) and an estimated total charge transfer of ∼0.24 electrons per two-dimensional unit cell.

Original languageEnglish
Article number262101
JournalApplied Physics Letters
Volume99
Issue number26
DOIs
Publication statusPublished - 2011 Dec 26

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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