Distribution of electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface revealed by hard x-ray photoemission spectroscopy

Y. Y. Chu; Y. F. Liao; V. T. Tra; J. C. Yang; W. Z. Liu; Y. H. Chu; J. Y. Lin; J. H. Huang; J. Weinen; S. Agrestini; K. D. Tsuei; D. J. Huang

doi:10.1063/1.3672099

Distribution of electronic reconstruction at the n-type LaAlO ₃/SrTiO ₃ interface revealed by hard x-ray photoemission spectroscopy

Y. Y. Chu, Y. F. Liao, V. T. Tra, J. C. Yang, W. Z. Liu, Y. H. Chu, J. Y. Lin, J. H. Huang, J. Weinen, S. Agrestini, K. D. Tsuei, D. J. Huang

Department of Physics

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

We investigated the electronic reconstruction at the n-type LaAlO ₃/SrTiO ₃ interface with hard x-ray photoelectron spectroscopy (HAXPES) under grazing incidence. By exploiting the collapse of evanescent x-ray waves and the abrupt increase of x-ray absorption at the critical incidence angle, our HAXPES study reveals a 2% electronic reconstruction from Ti ⁴⁺ to Ti ³⁺ occurring near the interface. Such an electronic reconstruction also extends from the interface into SrTiO ₃ with a depth of about 48Å (∼12 unit cells) and an estimated total charge transfer of ∼0.24 electrons per two-dimensional unit cell.

Original language	English
Article number	262101
Journal	Applied Physics Letters
Volume	99
Issue number	26
DOIs	https://doi.org/10.1063/1.3672099
Publication status	Published - 2011 Dec 26

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.3672099

Fingerprint Dive into the research topics of 'Distribution of electronic reconstruction at the n-type LaAlO <sub>3</sub>/SrTiO <sub>3</sub> interface revealed by hard x-ray photoemission spectroscopy'. Together they form a unique fingerprint.

Cite this

Chu, Y. Y., Liao, Y. F., Tra, V. T., Yang, J. C., Liu, W. Z., Chu, Y. H., Lin, J. Y., Huang, J. H., Weinen, J., Agrestini, S., Tsuei, K. D., & Huang, D. J. (2011). Distribution of electronic reconstruction at the n-type LaAlO ₃/SrTiO ₃ interface revealed by hard x-ray photoemission spectroscopy. Applied Physics Letters, 99(26), [262101]. https://doi.org/10.1063/1.3672099

@article{3d4625952c0b4965a6f356b87cb8fc18,

title = "Distribution of electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface revealed by hard x-ray photoemission spectroscopy",

abstract = "We investigated the electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface with hard x-ray photoelectron spectroscopy (HAXPES) under grazing incidence. By exploiting the collapse of evanescent x-ray waves and the abrupt increase of x-ray absorption at the critical incidence angle, our HAXPES study reveals a 2% electronic reconstruction from Ti 4+ to Ti 3+ occurring near the interface. Such an electronic reconstruction also extends from the interface into SrTiO 3 with a depth of about 48{\AA} (∼12 unit cells) and an estimated total charge transfer of ∼0.24 electrons per two-dimensional unit cell.",

author = "Chu, {Y. Y.} and Liao, {Y. F.} and Tra, {V. T.} and Yang, {J. C.} and Liu, {W. Z.} and Chu, {Y. H.} and Lin, {J. Y.} and Huang, {J. H.} and J. Weinen and S. Agrestini and Tsuei, {K. D.} and Huang, {D. J.}",

note = "Funding Information: We thank A. Fujimori and L. H. Tjeng for discussions and comments. National Science Council of Taiwan in part supported this work. The German part of the research is partially supported by the Deutsche Forschungsgemeinschaft through SFB 608 and FOR 1346. ",

year = "2011",

month = dec,

day = "26",

doi = "10.1063/1.3672099",

language = "English",

volume = "99",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "26",

}

Distribution of electronic reconstruction at the n-type LaAlO ₃/SrTiO ₃ interface revealed by hard x-ray photoemission spectroscopy. / Chu, Y. Y.; Liao, Y. F.; Tra, V. T.; Yang, J. C.; Liu, W. Z.; Chu, Y. H.; Lin, J. Y.; Huang, J. H.; Weinen, J.; Agrestini, S.; Tsuei, K. D.; Huang, D. J.

In: Applied Physics Letters, Vol. 99, No. 26, 262101, 26.12.2011.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Distribution of electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface revealed by hard x-ray photoemission spectroscopy

AU - Chu, Y. Y.

AU - Liao, Y. F.

AU - Tra, V. T.

AU - Yang, J. C.

AU - Liu, W. Z.

AU - Chu, Y. H.

AU - Lin, J. Y.

AU - Huang, J. H.

AU - Weinen, J.

AU - Agrestini, S.

AU - Tsuei, K. D.

AU - Huang, D. J.

N1 - Funding Information: We thank A. Fujimori and L. H. Tjeng for discussions and comments. National Science Council of Taiwan in part supported this work. The German part of the research is partially supported by the Deutsche Forschungsgemeinschaft through SFB 608 and FOR 1346.

PY - 2011/12/26

Y1 - 2011/12/26

N2 - We investigated the electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface with hard x-ray photoelectron spectroscopy (HAXPES) under grazing incidence. By exploiting the collapse of evanescent x-ray waves and the abrupt increase of x-ray absorption at the critical incidence angle, our HAXPES study reveals a 2% electronic reconstruction from Ti 4+ to Ti 3+ occurring near the interface. Such an electronic reconstruction also extends from the interface into SrTiO 3 with a depth of about 48Å (∼12 unit cells) and an estimated total charge transfer of ∼0.24 electrons per two-dimensional unit cell.

AB - We investigated the electronic reconstruction at the n-type LaAlO 3/SrTiO 3 interface with hard x-ray photoelectron spectroscopy (HAXPES) under grazing incidence. By exploiting the collapse of evanescent x-ray waves and the abrupt increase of x-ray absorption at the critical incidence angle, our HAXPES study reveals a 2% electronic reconstruction from Ti 4+ to Ti 3+ occurring near the interface. Such an electronic reconstruction also extends from the interface into SrTiO 3 with a depth of about 48Å (∼12 unit cells) and an estimated total charge transfer of ∼0.24 electrons per two-dimensional unit cell.

UR - http://www.scopus.com/inward/record.url?scp=84862961755&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84862961755&partnerID=8YFLogxK

U2 - 10.1063/1.3672099

DO - 10.1063/1.3672099

M3 - Article

AN - SCOPUS:84862961755

VL - 99

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 26

M1 - 262101

ER -