Abstract
We studied the role of reduced dimensionality and disorder in the superconducting properties of wafer-scale aluminum (Al) nanofilms. This new generation of ultrathin films were grown using molecular beam epitaxy and depict normal-state sheet resistance at least 20 times lower than the quantum resistance h/(4e2). Defying general expectations, the superconducting transition temperature of our films increases with decreasing Al film thickness, reaching 2.4 K for a 3.5-nm-thick Al film grown on GaAs: twice that of bulk Al (1.2 K). Surface phonon softening is shown to impact superconductivity in pure ultrathin films, offering a route for materials engineering in two dimensions.
Original language | English |
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Article number | 114801 |
Journal | Physical Review Materials |
Volume | 7 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2023 Nov |
All Science Journal Classification (ASJC) codes
- General Materials Science
- Physics and Astronomy (miscellaneous)