Drain Induced Barrier Lowering (DIBL) effect on the intrinsic capacitances of nano-scale MOSFETs

M. A. Karim, Sriramkumar Venugopalan, Yogesh Singh Chauhan, Darsen Lu, Ali Niknejad, Chenming Hu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

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Engineering & Materials Science