Dynamic ISD scheme for the AVM system - A preliminary study

Yao Sheng Hsieh, Fan Tien Cheng, Chun Fang Chen, Jhao Rong Lyu, Ting Yu Lin

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)


Reducing the sampling rate to as low as possible is a high priority for many factories to reduce production cost. Automatic-Virtual-Metrology (AVM) based Original Intelligent Sampling Decision (Original ISD) scheme had been previously developed for reducing the sampling rate and sustaining the VM accuracy. However, the desired sampling rate of the Original ISD scheme is fixed and set manually. Hence, whenever the VM accuracy gets worse, it cannot dynamically increase the desired sampling rate in the Original ISD scheme. As a consequence, it would take more time to collect enough samples for improving the VM accuracy. Moreover, when the VM accuracy performs well all the time, it cannot automatically decrease the desired sampling rate in Original ISD, which may result in unnecessary waste. Accordingly, this paper proposes a preliminary study of a Dynamic ISD scheme to dynamically and automatically modify the sampling rate online and in real time. The Dynamic ISD scheme can monitor the VM accuracy on line as well as update the VM models in real time for maintaining the VM accuracy when the VM accuracy becomes poor. Also, the Dynamic ISD scheme can automatically reduce the sampling rate while the VM accuracy performs well.

Original languageEnglish
Article number7139469
Pages (from-to)2060-2065
Number of pages6
JournalProceedings - IEEE International Conference on Robotics and Automation
Issue numberJune
Publication statusPublished - 2015 Jun 29
Event2015 IEEE International Conference on Robotics and Automation, ICRA 2015 - Seattle, United States
Duration: 2015 May 262015 May 30

All Science Journal Classification (ASJC) codes

  • Software
  • Control and Systems Engineering
  • Artificial Intelligence
  • Electrical and Electronic Engineering


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