Abstract
Reducing the sampling rate to as low as possible is a high priority for many factories to reduce production cost. Automatic-Virtual-Metrology (AVM) based Original Intelligent Sampling Decision (Original ISD) scheme had been previously developed for reducing the sampling rate and sustaining the VM accuracy. However, the desired sampling rate of the Original ISD scheme is fixed and set manually. Hence, whenever the VM accuracy gets worse, it cannot dynamically increase the desired sampling rate in the Original ISD scheme. As a consequence, it would take more time to collect enough samples for improving the VM accuracy. Moreover, when the VM accuracy performs well all the time, it cannot automatically decrease the desired sampling rate in Original ISD, which may result in unnecessary waste. Accordingly, this paper proposes a preliminary study of a Dynamic ISD scheme to dynamically and automatically modify the sampling rate online and in real time. The Dynamic ISD scheme can monitor the VM accuracy on line as well as update the VM models in real time for maintaining the VM accuracy when the VM accuracy becomes poor. Also, the Dynamic ISD scheme can automatically reduce the sampling rate while the VM accuracy performs well.
| Original language | English |
|---|---|
| Article number | 7139469 |
| Pages (from-to) | 2060-2065 |
| Number of pages | 6 |
| Journal | Proceedings - IEEE International Conference on Robotics and Automation |
| Volume | 2015-June |
| Issue number | June |
| DOIs | |
| Publication status | Published - 2015 Jun 29 |
| Event | 2015 IEEE International Conference on Robotics and Automation, ICRA 2015 - Seattle, United States Duration: 2015 May 26 → 2015 May 30 |
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All Science Journal Classification (ASJC) codes
- Software
- Control and Systems Engineering
- Artificial Intelligence
- Electrical and Electronic Engineering
Cite this
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Dynamic ISD scheme for the AVM system - A preliminary study. / Hsieh, Yao Sheng; Cheng, Fan-Tien; Chen, Chun Fang; Lyu, Jhao Rong; Lin, Ting Yu.
In: Proceedings - IEEE International Conference on Robotics and Automation, Vol. 2015-June, No. June, 7139469, 29.06.2015, p. 2060-2065.Research output: Contribution to journal › Conference article
TY - JOUR
T1 - Dynamic ISD scheme for the AVM system - A preliminary study
AU - Hsieh, Yao Sheng
AU - Cheng, Fan-Tien
AU - Chen, Chun Fang
AU - Lyu, Jhao Rong
AU - Lin, Ting Yu
PY - 2015/6/29
Y1 - 2015/6/29
N2 - Reducing the sampling rate to as low as possible is a high priority for many factories to reduce production cost. Automatic-Virtual-Metrology (AVM) based Original Intelligent Sampling Decision (Original ISD) scheme had been previously developed for reducing the sampling rate and sustaining the VM accuracy. However, the desired sampling rate of the Original ISD scheme is fixed and set manually. Hence, whenever the VM accuracy gets worse, it cannot dynamically increase the desired sampling rate in the Original ISD scheme. As a consequence, it would take more time to collect enough samples for improving the VM accuracy. Moreover, when the VM accuracy performs well all the time, it cannot automatically decrease the desired sampling rate in Original ISD, which may result in unnecessary waste. Accordingly, this paper proposes a preliminary study of a Dynamic ISD scheme to dynamically and automatically modify the sampling rate online and in real time. The Dynamic ISD scheme can monitor the VM accuracy on line as well as update the VM models in real time for maintaining the VM accuracy when the VM accuracy becomes poor. Also, the Dynamic ISD scheme can automatically reduce the sampling rate while the VM accuracy performs well.
AB - Reducing the sampling rate to as low as possible is a high priority for many factories to reduce production cost. Automatic-Virtual-Metrology (AVM) based Original Intelligent Sampling Decision (Original ISD) scheme had been previously developed for reducing the sampling rate and sustaining the VM accuracy. However, the desired sampling rate of the Original ISD scheme is fixed and set manually. Hence, whenever the VM accuracy gets worse, it cannot dynamically increase the desired sampling rate in the Original ISD scheme. As a consequence, it would take more time to collect enough samples for improving the VM accuracy. Moreover, when the VM accuracy performs well all the time, it cannot automatically decrease the desired sampling rate in Original ISD, which may result in unnecessary waste. Accordingly, this paper proposes a preliminary study of a Dynamic ISD scheme to dynamically and automatically modify the sampling rate online and in real time. The Dynamic ISD scheme can monitor the VM accuracy on line as well as update the VM models in real time for maintaining the VM accuracy when the VM accuracy becomes poor. Also, the Dynamic ISD scheme can automatically reduce the sampling rate while the VM accuracy performs well.
UR - http://www.scopus.com/inward/record.url?scp=84938262313&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84938262313&partnerID=8YFLogxK
U2 - 10.1109/ICRA.2015.7139469
DO - 10.1109/ICRA.2015.7139469
M3 - Conference article
AN - SCOPUS:84938262313
VL - 2015-June
SP - 2060
EP - 2065
JO - Proceedings - IEEE International Conference on Robotics and Automation
JF - Proceedings - IEEE International Conference on Robotics and Automation
SN - 1050-4729
IS - June
M1 - 7139469
ER -