Easily Testable Iterative Logic Arrays

Cheng Wen Wu, Peter R. Cappello

Research output: Contribution to journalArticle

58 Citations (Scopus)

Abstract

Iterative logic arrays (ILA) are studied with respect to two testing problems. First, a variety of conditions are presented which, when met, guarantee an upper bound on the size of the test set for the ILA under consideration. Second, techniques are presented for designing optimally testable ILA's. The arrays that are treated are, in some cases, more general than those that have been reported by other researchers: they include multidimensional and inhomogeneous arrays. Octagonally-connected arrays, hexagonally-connected arrays, and bilateral arrays also are discussed. The presented results indicate that the characteristics of the individual cell functions (e.g., whether they are bijective) are a good guide to the test complexity of the overall array. Matrix multiplication, as an example, is shown to have several different optimally testable implementations. The results are useful for combinational and pipelined arrays, and for certain systolic arrays.

Original languageEnglish
Pages (from-to)640-652
Number of pages13
JournalIEEE Transactions on Computers
Volume39
Issue number5
DOIs
Publication statusPublished - 1990 Jan 1

Fingerprint

Systolic arrays
Logic
Testing
Systolic Array
Matrix multiplication
Bijective
Test Set
Upper bound

All Science Journal Classification (ASJC) codes

  • Software
  • Theoretical Computer Science
  • Hardware and Architecture
  • Computational Theory and Mathematics

Cite this

Wu, Cheng Wen ; Cappello, Peter R. / Easily Testable Iterative Logic Arrays. In: IEEE Transactions on Computers. 1990 ; Vol. 39, No. 5. pp. 640-652.
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Easily Testable Iterative Logic Arrays. / Wu, Cheng Wen; Cappello, Peter R.

In: IEEE Transactions on Computers, Vol. 39, No. 5, 01.01.1990, p. 640-652.

Research output: Contribution to journalArticle

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