Economic analysis of the HOY wireless test methodology

Yutsao Hsing, Liming Denq, Chao Hsun Chen, Cheng Wen Wu

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

The HOY (Hypothesis, Odyssey, and Yield) test system provides wireless test access and embedded DFT, while offering lower cost and better performance than conventional ATE. This article briefly describes HOY, then proposes a test cost model to compare it with conventional ATE, and analyzes the test cost of these two methods for different manufacturing processes, area overheads, die sizes, manufacturing volumes, and test times.

Original languageEnglish
Article number5255193
Pages (from-to)20-30
Number of pages11
JournalIEEE Design and Test of Computers
Volume27
Issue number3
DOIs
Publication statusPublished - 2010 May 1

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

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