Economic analysis of the HOY wireless test methodology

Yutsao Hsing; Liming Denq; Chao Hsun Chen; Cheng Wen Wu

doi:10.1109/MDT.2009.96

Economic analysis of the HOY wireless test methodology

Yutsao Hsing, Liming Denq, Chao Hsun Chen, Cheng Wen Wu

Department of Electrical Engineering

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

The HOY (Hypothesis, Odyssey, and Yield) test system provides wireless test access and embedded DFT, while offering lower cost and better performance than conventional ATE. This article briefly describes HOY, then proposes a test cost model to compare it with conventional ATE, and analyzes the test cost of these two methods for different manufacturing processes, area overheads, die sizes, manufacturing volumes, and test times.

Original language	English
Article number	5255193
Pages (from-to)	20-30
Number of pages	11
Journal	IEEE Design and Test of Computers
Volume	27
Issue number	3
DOIs	https://doi.org/10.1109/MDT.2009.96
Publication status	Published - 2010 May 1

All Science Journal Classification (ASJC) codes

Software
Hardware and Architecture
Electrical and Electronic Engineering

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10.1109/MDT.2009.96

Cite this

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Economic analysis of the HOY wireless test methodology

Abstract

All Science Journal Classification (ASJC) codes

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