Economic analysis of the HOY wireless test methodology

Yutsao Hsing, Liming Denq, Chao Hsun Chen, Cheng Wen Wu

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Fingerprint Dive into the research topics of 'Economic analysis of the HOY wireless test methodology'. Together they form a unique fingerprint.

Engineering & Materials Science