Effect of a chemical modification on growth silicon dioxide films on gallium arsenide prepared by the liquid phase deposition method

C. J. Huang, M. P. Houng, Y. H. Wang, H. H. Wang

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26 Citations (Scopus)

Abstract

This article presents a chemical modification process to grow silicon dioxide (SiO2) on a gallium arsenide (GaAs) substrate using liquid phase deposition (LPD) at extremely low temperature (∼40°C). In this process, pretreatment of the wafer by ammonia solution with buffer kept at pH = 11-12 enriches OH radical formation on the GaAs surface, enhancing SiO2 deposition, providing good film quality, and reliability. The LPD SiO2 deposition rate on GaAs substrate is up to 1303 Å/h. The refractive index of the LPD SiO2 film on GaAs substrate is about 1.423 with growth at 40°C. When the LPD SiO2 film on GaAs substrate is used to fabricate a metal-oxide-semiconductor capacitor, the surface charge density (Qss/q) is about 3.7×1011 cm-2 and the leakage current is 43.3 pA at -5 V. A mechanism for the deposition of silicon dioxide on a GaAs substrate is proposed.

Original languageEnglish
Pages (from-to)7151-7155
Number of pages5
JournalJournal of Applied Physics
Volume86
Issue number12
DOIs
Publication statusPublished - 1999 Dec

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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