| Original language | English |
|---|---|
| Title of host publication | 5th Congress of the International Union of Microbeam Analysis Societies (IUMAS-V) |
| Place of Publication | Seoul Olympic Parktel, Seoul, Korea |
| Publication status | Published - 2011 May 22 |
Effect of Accelerating Voltage and Probe Current on EBSD Spatial Resolutions
Delphic Chen, Jui-Chao Kuo
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution