Original language | English |
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Title of host publication | International Conference & Exhibition on Advanced & Nano Materials (ICANM) |
Place of Publication | Montreal, Quebec, Canada |
Publication status | Published - 2016 Aug 1 |
Effect of Accelerating Voltage and Specimen Thickness on Spatial Resolutions of t-EBSD in Copper
Z.W. Shia, C.W. Kuo, T.Y. Kuo, Jui-Chao Kuo
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution