Abstract
In this paper, the finite element method based model for characterizing the electrode-skin interface is investigated. This electrode model is used to improve the accuracy of the forward solver. The number of elements designed in the interface are large enough to describe these effects about electrode-skin interface. The effect is verified by using the characteristic resistances. From the experimental results, it is shown that this model is in agreement with the physical phantom.
| Original language | English |
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| Title of host publication | IEEE International Conference on Image Processing |
| Publisher | IEEE Comp Soc |
| Pages | 837-840 |
| Number of pages | 4 |
| Volume | 3 |
| Publication status | Published - 1998 |
| Event | Proceedings of the 1998 International Conference on Image Processing, ICIP. Part 2 (of 3) - Chicago, IL, USA Duration: 1998 Oct 4 → 1998 Oct 7 |
Other
| Other | Proceedings of the 1998 International Conference on Image Processing, ICIP. Part 2 (of 3) |
|---|---|
| City | Chicago, IL, USA |
| Period | 98-10-04 → 98-10-07 |
All Science Journal Classification (ASJC) codes
- Computer Vision and Pattern Recognition
- Hardware and Architecture
- Electrical and Electronic Engineering