Effect of hot-carrier-induced interface states distribution on linear drain current degradation in 0.35 μm n-type lateral diffused metal-oxide- semiconductor transistors

J. R. Lee, Jone F. Chen, Kuo Ming Wu, C. M. Liu, S. L. Hsu

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

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Physics & Astronomy