Effect of hot-carrier-induced interface states distribution on linear drain current degradation in 0.35 μm n-type lateral diffused metal-oxide- semiconductor transistors

J. R. Lee, Jone F. Chen, Kuo Ming Wu, C. M. Liu, S. L. Hsu

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Fingerprint Dive into the research topics of 'Effect of hot-carrier-induced interface states distribution on linear drain current degradation in 0.35 μm n-type lateral diffused metal-oxide- semiconductor transistors'. Together they form a unique fingerprint.

Physics & Astronomy