TY - JOUR
T1 - Effect of inner electrode on reliability of (Zn,Mg)TiO 3-based multilayer ceramic capacitor
AU - Lee, Wen His
AU - Su, Chi Yi
AU - Lee, Ying Chieh
AU - Yang, Jackey
AU - Yang, Tong
AU - PinLin, Shih
PY - 2006/7/7
Y1 - 2006/7/7
N2 - In this study, different proportions of silver-palladium alloy acting as the inner electrode were adopted to a (Zn,Mg)TiO 3-based multilayer ceramic capacitor (MLCC) sintered at 925°C for 2 h to evaluate the effect of the inner electrode on reliability. The main results show that the lifetime is inversely proportional to Ag content in the Pd/Ag inner electrode. Ag +1 diffusion into the (Zn,Mg)TiO 3-based MLCC during cofiring at 925°C for 2 h and Ag +1 migration at 140°C against 200 V are both responsible for the short lifetime of the (Zn,Mg)TiO 3-based MLCC, particularly the latter factor. A (Zn,Mg)TiO 3-based MLCC with high Ag content in the inner electrode Ag/Pd = 99/01 exhibits the shortest lifetime (13 h), and the effect of Ag +1 migration is markedly enhanced when the activation energy of the (Zn,Mg)TiO 3 dielectric is greatly lowered due to the excessive formation of oxygen vacancies and the semiconducting Zn 2TiO 4 phase when Ag + substitutes for Zn +2 during co-firing.
AB - In this study, different proportions of silver-palladium alloy acting as the inner electrode were adopted to a (Zn,Mg)TiO 3-based multilayer ceramic capacitor (MLCC) sintered at 925°C for 2 h to evaluate the effect of the inner electrode on reliability. The main results show that the lifetime is inversely proportional to Ag content in the Pd/Ag inner electrode. Ag +1 diffusion into the (Zn,Mg)TiO 3-based MLCC during cofiring at 925°C for 2 h and Ag +1 migration at 140°C against 200 V are both responsible for the short lifetime of the (Zn,Mg)TiO 3-based MLCC, particularly the latter factor. A (Zn,Mg)TiO 3-based MLCC with high Ag content in the inner electrode Ag/Pd = 99/01 exhibits the shortest lifetime (13 h), and the effect of Ag +1 migration is markedly enhanced when the activation energy of the (Zn,Mg)TiO 3 dielectric is greatly lowered due to the excessive formation of oxygen vacancies and the semiconducting Zn 2TiO 4 phase when Ag + substitutes for Zn +2 during co-firing.
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U2 - 10.1143/JJAP.45.5859
DO - 10.1143/JJAP.45.5859
M3 - Article
AN - SCOPUS:33746846531
SN - 0021-4922
VL - 45
SP - 5859
EP - 5864
JO - Japanese Journal of Applied Physics
JF - Japanese Journal of Applied Physics
IS - 7
ER -