Effect of nonannealed ohmic-recess structure on temperature-dependent characteristics of metamorphic high-electron-mobility transistors

Li Yang Chen, Shiou Ying Cheng, Kuei Yi Chu, Tsung Han Tsai, Tzu Pin Chen, Ching Wen Hung, Wen Chau Liu

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

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Chemical Compounds

Engineering & Materials Science