Effects of drift-region design on the reliability of integrated high-voltage LDMOS transistors

Jone F. Chen, Shiang Yu Chen, Kuen Shiuan Tian, Kuo Ming Wu, Yan Kuin Su, C. M. Liu, S. L. Hsu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

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Engineering & Materials Science