Effects of electrical and temperature stress on polysilicon resistors for CMOS technology applications

Kong Beng Thei, Hung Ming Chuang, Sheng Fu Tsai, Chun Tsen Lu, Xin Da Liao, Kuan Ming Lee, Wen Chau Liu

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

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Engineering & Materials Science

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Chemical Compounds