Effects of Film Orientation on Power Consumption, Thermal Stability, and Reliability of Aluminum Nitride Resistive Random Access Memory Devices

Chun Cheng Lin, Huei Yu Liou, Pei Hao Hung, Sheng Yuan Chu, Chih Yu Huang, Cheng Shong Hong

Research output: Contribution to journalArticle

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Chemical Compounds

Engineering & Materials Science