Effects of lithium doping on microstructure, electrical properties, and chemical bonds of sol-gel derived NKN thin films

Chun Cheng Lin, Chan Ching Chen, Chung Ming Weng, Sheng-Yuan Chu, Cheng Shong Hong, Cheng Che Tsai

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Highly (100/110) oriented lead-free Lix(Na0.5K0.5)1-xNbO3 (LNKN, x = 0, 0.02, 0.04, and 0.06) thin films are fabricated on Pt/Ti/SiO2/Si substrates via a sol-gel processing method. The lithium (Li) dopants modify the microstructure and chemical bonds of the LNKN films, and therefore improve their electrical properties. The optimal values of the remnant polarization (Pr = 14.3 μC/cm2), piezoelectric coefficient (d33 = 48.1 pm/V), and leakage current (<10-5 A/cm2) are obtained for a lithium addition of x = 0.04 (i.e.; 4 at. %). The observation results suggest that the superior electrical properties are the result of an improved crystallization, a larger grain size, and a smoother surface morphology. It is shown that the ion transport mechanism is dominated by an Ohmic behavior under low electric fields and the Poole-Frenkel emission effect under high electric fields.

Original languageEnglish
Article number085307
JournalJournal of Applied Physics
Volume117
Issue number8
DOIs
Publication statusPublished - 2015 Feb 28

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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