Effects of mechanical uniaxial stress on SiGe HBT characteristics

Tzu Juei Wang, Hung Wei Chen, Chih Hsin Ko, John Yeh, Ping Chun Yeh, Shoou-Jinn Chang, San Lein Wu, Wen Chin Lee, Denny D. Tang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationThird International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest
Publication statusPublished - 2006 Dec 1
EventThird International SiGe Technology and Device Meeting, ISTDM 2006 - Princeton, NJ, United States
Duration: 2006 May 152006 May 17

Publication series

NameThird International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest
Volume2006

Other

OtherThird International SiGe Technology and Device Meeting, ISTDM 2006
CountryUnited States
CityPrinceton, NJ
Period06-05-1506-05-17

All Science Journal Classification (ASJC) codes

  • Computer Science(all)
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics

Cite this

Wang, T. J., Chen, H. W., Ko, C. H., Yeh, J., Yeh, P. C., Chang, S-J., Wu, S. L., Lee, W. C., & Tang, D. D. (2006). Effects of mechanical uniaxial stress on SiGe HBT characteristics. In Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest [1715971] (Third International SiGe Technology and Device Meeting, ISTDM 2006 - Conference Digest; Vol. 2006).