TY - JOUR
T1 - Effects of the addition of alumina on the crystallization, densification and dielectric properties of CaO-MgO-Al2O3-SiO2 glass in the presence of ZrO2
AU - Hsiang, Hsing I.
AU - Yung, Shi Wen
AU - Wang, Chung Ching
N1 - Funding Information:
This work was financially sponsored by the National Science Council Taiwan and Inpaq Technology Co. Ltd. ( 98-2622-E-006-011-CC2 ).
PY - 2014/12/1
Y1 - 2014/12/1
N2 - The alumina addition effects on the crystallization, sintering behaviors and dielectric properties of CaO-MgO-Al2O3-SiO2 glass (CMAS) and CaO-MgO-Al2O3-SiO2-ZrO2 (CMASZ) were investigated using the differential thermal analyzer (DTA), dilatometer, scanning electron microscopy (SEM) and X-ray diffractometer (XRD). For CMAS glass, the phyllosiloxide crystallized first and then anorthite crystallites were observed during sintering at 800-950 °C. The crystallization temperature of phyllosiloxide shifted from 800 °C to 850 °C after adding ZrO2 to the glass. For CMAS glass added with 10 vol% alumina, the acicular phyllosiloxide phase, intergrowth anorthite and subrounded alumina particles were observed. For CMASZ glass added with 10 vol% alumina sintered at 900 °C for 1 h, homogeneously distributed zirconia precipitates, subrounded alumina particles and a small amount of acicular phyllosiloxide were found in the dense glass matrix. The CMASZ glass added with 10 vol% alumina sintered at 900 °C exhibited a dense microstructure, a low dielectric constant of 7.5 and a dielectric loss tangent of below 5×10-3, which provides a promising candidate for LTCC applications.
AB - The alumina addition effects on the crystallization, sintering behaviors and dielectric properties of CaO-MgO-Al2O3-SiO2 glass (CMAS) and CaO-MgO-Al2O3-SiO2-ZrO2 (CMASZ) were investigated using the differential thermal analyzer (DTA), dilatometer, scanning electron microscopy (SEM) and X-ray diffractometer (XRD). For CMAS glass, the phyllosiloxide crystallized first and then anorthite crystallites were observed during sintering at 800-950 °C. The crystallization temperature of phyllosiloxide shifted from 800 °C to 850 °C after adding ZrO2 to the glass. For CMAS glass added with 10 vol% alumina, the acicular phyllosiloxide phase, intergrowth anorthite and subrounded alumina particles were observed. For CMASZ glass added with 10 vol% alumina sintered at 900 °C for 1 h, homogeneously distributed zirconia precipitates, subrounded alumina particles and a small amount of acicular phyllosiloxide were found in the dense glass matrix. The CMASZ glass added with 10 vol% alumina sintered at 900 °C exhibited a dense microstructure, a low dielectric constant of 7.5 and a dielectric loss tangent of below 5×10-3, which provides a promising candidate for LTCC applications.
UR - http://www.scopus.com/inward/record.url?scp=84912534334&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84912534334&partnerID=8YFLogxK
U2 - 10.1016/j.ceramint.2014.07.107
DO - 10.1016/j.ceramint.2014.07.107
M3 - Article
AN - SCOPUS:84912534334
VL - 40
SP - 15807
EP - 15813
JO - Ceramics International
JF - Ceramics International
SN - 0272-8842
IS - 10
ER -