Effects of the addition of alumina on the crystallization, densification and dielectric properties of CaO-MgO-Al2O3-SiO2 glass in the presence of ZrO2

Hsing I. Hsiang, Shi Wen Yung, Chung Ching Wang

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18 Citations (Scopus)

Abstract

The alumina addition effects on the crystallization, sintering behaviors and dielectric properties of CaO-MgO-Al2O3-SiO2 glass (CMAS) and CaO-MgO-Al2O3-SiO2-ZrO2 (CMASZ) were investigated using the differential thermal analyzer (DTA), dilatometer, scanning electron microscopy (SEM) and X-ray diffractometer (XRD). For CMAS glass, the phyllosiloxide crystallized first and then anorthite crystallites were observed during sintering at 800-950 °C. The crystallization temperature of phyllosiloxide shifted from 800 °C to 850 °C after adding ZrO2 to the glass. For CMAS glass added with 10 vol% alumina, the acicular phyllosiloxide phase, intergrowth anorthite and subrounded alumina particles were observed. For CMASZ glass added with 10 vol% alumina sintered at 900 °C for 1 h, homogeneously distributed zirconia precipitates, subrounded alumina particles and a small amount of acicular phyllosiloxide were found in the dense glass matrix. The CMASZ glass added with 10 vol% alumina sintered at 900 °C exhibited a dense microstructure, a low dielectric constant of 7.5 and a dielectric loss tangent of below 5×10-3, which provides a promising candidate for LTCC applications.

Original languageEnglish
Pages (from-to)15807-15813
Number of pages7
JournalCeramics International
Volume40
Issue number10
DOIs
Publication statusPublished - 2014 Dec 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Process Chemistry and Technology
  • Surfaces, Coatings and Films
  • Materials Chemistry

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