Abstract
In this paper, we demonstrate the AlGaN/GaN high electron mobility transistors (HEMTs) on Si substrate using an AlGaN back-barrier (BB) and super-lattice (SL) buffer to achieve high breakdown and low current collapse (CC) properties for Radio-frequency (RF) applications. The HEMTs also demonstrated low initial vertical leakage current, high thermal stability, and smaller drain-lag with reduced leakage currents as compared to the devices using step-graded (SG) AlGaN buffer. Also, the device showed improved RF performances with higher f T and f max as compared to the devices with SG buffer.
| Original language | English |
|---|---|
| Article number | 035002 |
| Journal | ECS Journal of Solid State Science and Technology |
| Volume | 12 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 2023 Mar |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
Fingerprint
Dive into the research topics of 'Effects on RF Performance for AlGaN/GaN HEMT on Si Substrate with AlGaN Buffer Engineering'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver