Efficiency enhancement and polarization detection capability of photodiode by accumulating local electric field on the metal electrodes

Yu Sheng Lai, Hsuen Li Chen, C. H. Lin, Han Ching Lin, Szu Huang Chen, H. M. Chang, S. C. Tseng, Y. M. Chi, Chia Hua Ho, Fu Liang Yang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

By chiral-shape patterns over finger-type electrodes of conventional photodiode, for the first time, record high >80% external quantum efficiency (EQE) and polarization detection capability are successfully achieved simultaneously through the self-accumulated local electric field due to strong local surface plasmon resonance (LSPR). Device has expected high efficiency to absorb the incident visible energy profiting the visible applications potentially, such as artificial eyes. Extraordinary transmission phenomenon can be well examimed indepth by both theoretical and experimental results discussed in this work.

Original languageEnglish
Title of host publication2010 IEEE International Electron Devices Meeting, IEDM 2010
Pages14.6.1-14.6.4
DOIs
Publication statusPublished - 2010
Event2010 IEEE International Electron Devices Meeting, IEDM 2010 - San Francisco, CA, United States
Duration: 2010 Dec 62010 Dec 8

Publication series

NameTechnical Digest - International Electron Devices Meeting, IEDM
ISSN (Print)0163-1918

Other

Other2010 IEEE International Electron Devices Meeting, IEDM 2010
CountryUnited States
CitySan Francisco, CA
Period10-12-0610-12-08

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

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    Lai, Y. S., Chen, H. L., Lin, C. H., Lin, H. C., Chen, S. H., Chang, H. M., Tseng, S. C., Chi, Y. M., Ho, C. H., & Yang, F. L. (2010). Efficiency enhancement and polarization detection capability of photodiode by accumulating local electric field on the metal electrodes. In 2010 IEEE International Electron Devices Meeting, IEDM 2010 (pp. 14.6.1-14.6.4). [5703363] (Technical Digest - International Electron Devices Meeting, IEDM). https://doi.org/10.1109/IEDM.2010.5703363