Efficient and Economical Test Equipment Setup Using Procorrelation

Bin Hong Lin, Cheng Wen Wu, Hwei Tsu Ann Luh

Research output: Contribution to journalArticlepeer-review

Abstract

A correlation evaluation system called the Procorrelation System (PCS) is discussed. PCS system is used for obtaining high-quality correlation between die failures on premanufactured recorded correlation wafer (RCW) and the wafer test equipment setup. PCS is a simple, fast, efficient, and economical software system used for the automatic verification of the ATE setup before the starting of the mass production process. It also facilitates the failure diagnosis and recovery in equipment setup. PCS greatly reduces analysis time and test costs, when compared with the conventional full-wafer probing techniques.

Original languageEnglish
Pages (from-to)34-43
Number of pages10
JournalIEEE Design and Test of Computers
Volume21
Issue number1
DOIs
Publication statusPublished - 2004 Jan 1

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

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