Efficient BIST method for small buffers

W. B. Jone, D. C. Huang, S. C. Wu, Kuen-Jong Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

19 Citations (Scopus)

Abstract

In this work, we propose a new built-in self-testing (BIST) method that is able to concurrently test a set of spatially distributed embedded-memory modules with different sizes. By allowing some redundant read/write operations for small modules, we develop a new march algorithm, called RSMarch, that can concurrently test all memory modules with the same fault coverage as if each module is tested individually. We also show that this method requires only one simple BIST controller and one test data line for all modules. Thus the new method has the advantages of short test time, high fault coverage and low area overhead.

Original languageEnglish
Title of host publicationProceedings of the IEEE VLSI Test Symposium
PublisherIEEE
Pages246-251
Number of pages6
ISBN (Print)076950146X
Publication statusPublished - 1999
EventProceedings of the 1999 17th IEEE VLSI Test Symposium (VTS'99) - Dana Point, CA, USA
Duration: 1999 Apr 251999 Apr 29

Other

OtherProceedings of the 1999 17th IEEE VLSI Test Symposium (VTS'99)
CityDana Point, CA, USA
Period99-04-2599-04-29

Fingerprint

Data storage equipment
Testing
Controllers

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Jone, W. B., Huang, D. C., Wu, S. C., & Lee, K-J. (1999). Efficient BIST method for small buffers. In Proceedings of the IEEE VLSI Test Symposium (pp. 246-251). IEEE.
Jone, W. B. ; Huang, D. C. ; Wu, S. C. ; Lee, Kuen-Jong. / Efficient BIST method for small buffers. Proceedings of the IEEE VLSI Test Symposium. IEEE, 1999. pp. 246-251
@inproceedings{f635001d53384e3c9ddd3e6cc3189830,
title = "Efficient BIST method for small buffers",
abstract = "In this work, we propose a new built-in self-testing (BIST) method that is able to concurrently test a set of spatially distributed embedded-memory modules with different sizes. By allowing some redundant read/write operations for small modules, we develop a new march algorithm, called RSMarch, that can concurrently test all memory modules with the same fault coverage as if each module is tested individually. We also show that this method requires only one simple BIST controller and one test data line for all modules. Thus the new method has the advantages of short test time, high fault coverage and low area overhead.",
author = "Jone, {W. B.} and Huang, {D. C.} and Wu, {S. C.} and Kuen-Jong Lee",
year = "1999",
language = "English",
isbn = "076950146X",
pages = "246--251",
booktitle = "Proceedings of the IEEE VLSI Test Symposium",
publisher = "IEEE",

}

Jone, WB, Huang, DC, Wu, SC & Lee, K-J 1999, Efficient BIST method for small buffers. in Proceedings of the IEEE VLSI Test Symposium. IEEE, pp. 246-251, Proceedings of the 1999 17th IEEE VLSI Test Symposium (VTS'99), Dana Point, CA, USA, 99-04-25.

Efficient BIST method for small buffers. / Jone, W. B.; Huang, D. C.; Wu, S. C.; Lee, Kuen-Jong.

Proceedings of the IEEE VLSI Test Symposium. IEEE, 1999. p. 246-251.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Efficient BIST method for small buffers

AU - Jone, W. B.

AU - Huang, D. C.

AU - Wu, S. C.

AU - Lee, Kuen-Jong

PY - 1999

Y1 - 1999

N2 - In this work, we propose a new built-in self-testing (BIST) method that is able to concurrently test a set of spatially distributed embedded-memory modules with different sizes. By allowing some redundant read/write operations for small modules, we develop a new march algorithm, called RSMarch, that can concurrently test all memory modules with the same fault coverage as if each module is tested individually. We also show that this method requires only one simple BIST controller and one test data line for all modules. Thus the new method has the advantages of short test time, high fault coverage and low area overhead.

AB - In this work, we propose a new built-in self-testing (BIST) method that is able to concurrently test a set of spatially distributed embedded-memory modules with different sizes. By allowing some redundant read/write operations for small modules, we develop a new march algorithm, called RSMarch, that can concurrently test all memory modules with the same fault coverage as if each module is tested individually. We also show that this method requires only one simple BIST controller and one test data line for all modules. Thus the new method has the advantages of short test time, high fault coverage and low area overhead.

UR - http://www.scopus.com/inward/record.url?scp=0032685524&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0032685524&partnerID=8YFLogxK

M3 - Conference contribution

SN - 076950146X

SP - 246

EP - 251

BT - Proceedings of the IEEE VLSI Test Symposium

PB - IEEE

ER -

Jone WB, Huang DC, Wu SC, Lee K-J. Efficient BIST method for small buffers. In Proceedings of the IEEE VLSI Test Symposium. IEEE. 1999. p. 246-251