Efficient Neighborhood Pattern-Sensitive Fault Test Algorithms for Semiconductor Memories

K.-L. Cheng, M.-F. Tsai, Cheng-Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

19 Citations (Scopus)
Original languageEnglish
Title of host publicationIEEE VLSI Test Symp. (VTS)
Place of Publication Marina Del Rey, California
Publication statusPublished - 2001 Apr

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